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TTTC's
Electronic Broadcasting Service |
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| 2nd IEEE International Workshop on Held in Conjunction with ITC Test Week (ITC 2008) |
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FOR PAPERS |
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| The workshop will examine where the ATE industry is heading in the near-term as well as in the long-term. Integrated circuits get denser, larger, and faster and more heterogeneous. As the number of dies in a single package increases, so does the test quality target. Certain dies require Known-Good-Die (KGD) quality levels, whereas more complex failure modes already challenge our yield learning curves.
These issues, when added to increasing Cost-Of-Test (COT), Time-To-Volume (TTV), and Time-To-Market (TTM) pressures, driven by today’s high-volume market applications, pose significant challenges to the ATE industry. To meet those challenges the industry needs to innovate in areas such as test methodologies, interconnection technologies, architectures, and Design-For-Testability (DFT) and Design-For-Manufacturability (DFM) technologies. The goal of this workshop is to create an informal forum to discuss those innovations relevant to ATE developers and users. We are looking for solutions to the issues of 2012 and beyond, not those of 2009. What are companies doing today to address needs five years out? What are the test solutions for new technologies such as quantum computing, bio-computing, or cloud computing? Are our present technologies adequate for the future, and what should we be doing to close the gaps? We are not looking for a standard paper filled with results, we are looking for speculation. And 2020 refers to vision: you do not need to predict what testing will be like that far in the future! Representative topics include, but are not limited to:
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| To present at the Workshop, authors are invited to submit presentation proposals. The proposals may be draft presentations, extended abstracts (500 words), or full papers. Each submission should include: title, full name and affiliation of all authors, a short abstract of 50 words, and keywords. Also, identify a contact author and include a complete correspondence address, phone number, fax number, and e-mail address.
Authors will be notified of the disposition of their presentation by September 19, 2008. Authors of accepted presentations must submit the final presentation by October 3, 2008 for inclusion in the Workshop Notes, which will be provided to the attendees on a memory stick. Optionally, an extended abstract or paper can also be included in the notes. |
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| Submission deadline: August 22, 2008 |
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| Committees | |
| General Chair General Co-Chair Program Chair Program Co-Chair Panel Chair Finance Chair Publicity Chair Webmaster Program Committee R. Barth, Numonyx |
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| Additional Information | |
General Information
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| For
more information, visit us on the web at: www.ATEVision.com |
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ATE Vision 2020 is sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC). |
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IEEE
Computer Society- Test Technology Technical Council |
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